For our members who have a metrology background: A short reference document describing the general technique of ellipsometry used by the optics group at the APS.
Follow the light: Ellipsometry and polarimetry by Hans Arwin and David E. Aspnes
On Friday, January 22, the Illiana Section of ASQ will host its third annual conference, entitled “Quality: The View from the Inside.” The conference will be held at Calumet College of St. Joseph, which is located at 2400 New York Avenue in Whiting, Indiana. Registration will begin and 8:00 a.m., and the program is scheduled to start at 8:30 a.m. The conference will conclude at 4:00 p.m.
We’ve again assembled a distinguished set of speakers. In turn, three plenary sessions will address:
Two sets of breakout sessions will address case studies pertaining to various steps in the business value chain.
We hope you’ll be able to join us. Mark your calendar and register now for ASQ Section 1213’s third annual conference which will take place on Friday, January 22, 2010!
The ASQ Market Research department has released its Section Loyalty and Satisfaction Study Findings.
The study, conducted earlier this year, lays out responses to a variety of questions regarding Section Loyalty and Satisfaction with regard to products, pricing, image, individual learning and professional resources.
You can view the entire findings document here:
Section Loyalty & Satisfaction Study Findings – PowerPoint | PDF
