Archives for December, 2009

Quick Study – Follow the light: Ellipsometry and polarimetry

For our members who have a metrology background: A short reference document describing the general technique of ellipsometry used by the optics group at the APS.


ASQ 3rd Annual Conference set for January 22

On Friday, January 22, the Illiana Section of ASQ will host its third annual conference, entitled “Quality: The View from the Inside.” The conference will be held at Calumet College of St. Joseph, which is located at 2400 New York Avenue in Whiting, Indiana.